Advanced 2D Surface Feature Measurement for InspecVision Planar
InspecVision’s new Area of Interest (AOI) option introduces a breakthrough capability for 2D inspection systems: the ability to measure surface features, and non through features, not just silhouettes.
Traditionally, Planar 2D inspection systems are limited to capturing outline geometry. With the addition of AOI, manufacturers can now inspect critical surface-level features using Lights From Above (LFA) technology – unlocking a new class of applications for sheet metal, printed, and assembled parts.
The AOI option integrates directly with the Planar software and workflow and can be retrofitted to any existing Planar system for a cost effective solution to instantly expand machine capabilities.
How AOI Works
The AOI option uses controlled overhead lighting to illuminate pre-defined surface regions. The Planar camera then captures and analyzes these features with high-resolution 2d imaging. Only the selected critical features are measured, even if the part contains thousands of possible features or markings.
This system addition enables fast, targeted, and highly repeatable inspection of previously unreachable features like shallow pockets, edges, printed features, and blind surfaces.
Measure What Other Systems Can’t
With the AOI upgrade, the Planar system can instantly capture a range of surface and embedded features including:
- Pin or insert diameters
- Countersinks, bevels, chamfers, and slots
- Blind holds and recesses features
- Gaskets and raised surface geometry
- Printed materials, labels, and stickers
- PCBs, flexible PCBs, and RFIDs
- Internal flanges or tabs
Single-Click Targeted Inspection
The AOI system is designed for efficiency and automation. Once Areas of Interest are defined within an inspection program, Planar automatically illuminates, captures, and measures each zone with no manual setup required.
The AOI workflow becomes:
- Place the part on the Planar stage glass
- Select or scan the job
- Inspect | measure critical features | generate results
Improve cycle times and adapt to inspect complex components with ease.
Why AOI Matters for Your Application
AOI turns the Planar system into a more versatile metrology system by enabling simultaneous inspection of both edges and surface features – closing the gap between 2D and 3D measurement needs.
Applicable to many manufacturing industries, this option maximizes the initial equipment investment for:
- Increased inspection capabilities
- Reduced fixturing time
- Shortened cycle times
- Added control for measuring surface-critical components